Zugriffsnummer 29293
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Quantitative assessment of nano wear of DLC coated samples using AFM and optical confocal microscopy
Autor(in); Institution
Dai, Gaoliang; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Pohlenz, Frank; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Bosse, Harald; 5, Fertigungsmesstechnik, PTB-Braunschweig
Kovalev, A.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Spaltmann, D.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Woyd, M.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Quelle/Jahr Proceedings of the 13th International Conference of the European Society for Precision Engineering and Nanotechnology: 1 (2013), 124 - 127
Herausgeber(in)
Leach, R.
ISBN 978-0-9566790-2-4
Verlag Bedford: Euspen
Konferenzangaben Euspen Conference, 13th International Conference of the european society for precision engineering and nanotechnology, Berlin, 27-31, May, 2013, Germany
Freie Schlagworte AFM ; DLC-coated
Zusammenfassung Nano wear of high-performance DLC-based thin film coatings, which had undergone tribological tests under rolling/slip-rolling conditions, was quantitatively assessed using calibrated AFM and confocal microscopy. Different areal S-parameters such as arithmetic average roughness Sa, root mean square roughness Sq, surface skewness Ssk, as well as areal V-parameters (related to Abbott-Firestone curve) have been evaluated from the AFM images measured from the worn and unworn areas. The cumulative distributions of surface area, projected area and material volume (loss) were analyzed in addition. The study shows that for the analyzed S-parameters the skewness Ssk was the most sensitive and reliable parameter to indicate the very small wear-related changes of the DLC-coated surface.

Zitierung

Dai, G., Pohlenz, F., Bosse, H., Kovalev, A., Spaltmann, D., & Woyd, M. (2013). Quantitative assessment of nano wear of DLC coated samples using AFM and optical confocal microscopy. Euspen Conference, 13th International Conference of the european society for precision engineering and nanotechnology, Berlin, 27-31, May, 2013, Germany.

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