| Zugriffsnummer | 28935 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Characterization of backside-illuminated CMOS APS prototypes for the extreme ultraviolet imager on-board solar orbiter |
| Autor(in); Institution |
BenMoussa, Ali; Solar Terrestrial Center of Excellence, Royal Observatory of Belgium, Brussels, BELGIUM
Giordanengo, Boris; Solar Terrestrial Center of Excellence, Royal Observatory of Belgium, Brussels, BELGIUM
Gissot, Samuel; Solar Terrestrial Center of Excellence, Royal Observatory of Belgium, Brussels, BELGIUM
Meynants, Guy; CMOSIS nv, Antwerpen, BELGIUM
Wang, Xinyang; CMOSIS nv, Antwerpen, BELGIUM
Wolfs, Bram; CMOSIS nv, Antwerpen, BELGIUM
Bogaerts, Jan; CMOSIS nv, Antwerpen, BELGIUM
Schühle, Udo; Max-Planck-Institut Für Sonnensystemforschung, Katlenburg-Lindau, GERMANY
Berger, Guy; Catholic University of Louvain-la-Neuve, Louvain la Neuve, BELGIUM
Gottwald, Alexander; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Laubis, Christian; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Kroth, Udo; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Scholze, Frank; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
|
| Quelle/Jahr | IEEE Transactions on Electron Devices: 60 (2013), 5, 1701 - 1708 |
| ISSN | 0018-9383 |
| DOI | |
| Verlag | New York, NY: IEEE |
| Freie Schlagworte | Calibration ; CMOS image sensors ; space technology |
| Zusammenfassung | For the Extreme Ultraviolet Imager (EUI) of the Solar Orbiter mission, to be launched in 2017, CMOS active pixel sensor (APS) prototypes have been developed with several test pixel designs. A set of measurements was carried out to evaluate their performance characteristics in visible and in extreme ultraviolet wavelengths. We present the results of measurement campaigns that lead to the selection of a preferred pixel design in regard to the scientific performance requirements of the EUI flight model detectors, i.e., back-thinned CMOS APS devices of 2048 × 2048 and 3072 × 3072 pixel formats with a 10-μm pixel pitch. |
Zitierung
BenMoussa, A., Giordanengo, B., Gissot, S., Meynants, G., Wang, X., Wolfs, B., Bogaerts, J., Schühle, U., Berger, G., Gottwald, A., Laubis, C., Kroth, U., & Scholze, F. (2013). Characterization of backside-illuminated CMOS APS prototypes for the extreme ultraviolet imager on-board solar orbiter. IEEE Transactions on Electron Devices, 60(5), 1701–1708. https://doi.org/10.1109/ted.2013.2255103