Zugriffsnummer 28615
Dokumenttyp Konferenzartikel in Zeitschrift Freier Zugang
Peer Review mit Peer Review
Sprache Englisch
Titel Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment
Autor(in); Institution
Lotkhov, Sergey V.; 2.4, Quantenelektronik, PTB-Braunschweig
Zorin, Alexander B.; 2.4, Quantenelektronik, PTB-Braunschweig
Quelle/Jahr Journal of Physics: Conference Series: 400 (2012), Pt. 4, 042040-1 - 042040-5
ISSN 1742-6596
DOI
URL
Verlag Bristol: IOP
Konferenzangaben 26th International Conference on Low Temperature Physics (LT26), Beijing, 10-17, August, 2011, China
Klassifikationscode PACS: 74.25.Fy ; PACS: 84.32.Ff ; PACS: 73.50.Gr
Freie Schlagworte Superconductivity ; Electronics and devices
Zusammenfassung Dissipative properties of the electromagnetic environment as well as on-chip RC ltering are shown to suppress random state switchings in the two-junction superconductor(S) - normal metal(N) electron trap. In our experiments, a local high-ohmic resistor increased the hold time of the trap by up to two orders of magnitude. A strong effect of on-chip noise ltering was observed for dierent on-chip geometries. The obtained results are promising for realization of the current standard on the basis of the S-N hybrid turnstile.
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Zitierung

Lotkhov, S. V. & Zorin, A. B. (2012). Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment. Journal of Physics: Conference Series, 400(Pt. 4), 042040-1–042040-5. https://doi.org/10.1088/1742-6596/400/4/042040

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