Femtosecond dark-field imaging with an X-ray free electron laser

Martin, A. V.; Loh, N. D.; Hampton, C. Y.; Sierra, R. G.; Wang, F.; Aquila, A.; Bajt, S.; Barthelmess, M.; Bostedt, C.; Bozek, J. D.; Coppola, N.; Epp, S. W.; Erk, B.; Fleckenstein, H.; Foucar, L.; Frank, M.; Graafsma, H.; Gumprecht, L.; Hartmann, A.; Hartmann, R.; Hauser, G.; Hirsemann, H.; Holl, P.; Kassemeyer, S.; Kimmel, N.; Liang, M.; Lomb, L.; Maia, F. R. N. C.; Marchesini, S.; Nass, K.; Pedersoli, E.; Reich, C.; Rolles, D.; Rudek, B.; Rudenko, A.; Schulz, J.; Shoeman, R. L.; Soltau, H.; Starodub, D.; Steinbrener, J.; Stellato, F.; Strüder, L.; Ullrich, Joachim; Weidenspointner, G.; White, T. A.; Wunderer, C. B.; Barty, A.; Schlichting, I.; Bogan, M. J.; Chapman, H. N.

doi:https://doi.org/10.1364/oe.20.013501

Zugriffsnummer	28480
Dokumenttyp	Zeitschriftenartikel
Peer Review	mit Peer Review
Sprache	Englisch
Titel	Femtosecond dark-field imaging with an X-ray free electron laser
Autor(in); Institution	Martin, A. V.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Loh, N. D.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Hampton, C. Y.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Sierra, R. G.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Wang, F.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Aquila, A.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY; European XFEL GmbH, Hamburg, GERMANY; Photon Science, DESY, Hamburg, GERMANY Bajt, S.; Photon Science, DESY, Hamburg, GERMANY Barthelmess, M.; Photon Science, DESY, Hamburg, GERMANY Bostedt, C.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Bozek, J. D.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Coppola, N.; European XFEL GmbH, Hamburg, GERMANY Epp, S. W.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für Kernphysik, Heidelberg, GERMANY Erk, B.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für Kernphysik, Heidelberg, GERMANY Fleckenstein, H.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Foucar, L.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Frank, M.; Lawrence Livermore National Laboratory, Livermore, Calif., USA Graafsma, H.; Photon Science, DESY, Hamburg, GERMANY Gumprecht, L.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Hartmann, A.; PNSensor GmbH, München, GERMANY Hartmann, R.; PNSensor GmbH, München, GERMANY Hauser, G.; Max-Planck-Institut Halbleiterlabor, München, GERMANY; Max-Planck-Institut für extraterrestrische Physik, Garching, GERMANY Hirsemann, H.; Photon Science, DESY, Hamburg, GERMANY Holl, P.; PNSensor GmbH, München, GERMANY Kassemeyer, S.; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Kimmel, N.; Max-Planck-Institut Halbleiterlabor, München, GERMANY; Max-Planck-Institut für extraterrestrische Physik, Garching, GERMANY Liang, M.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Lomb, L.; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Maia, F. R. N. C.; NERSC, Lawrence Berkeley National Laboratory, Berkeley, Calif., USA Marchesini, S.; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, Calif., USA Nass, K.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY; University of Hamburg, Hamburg, GERMANY Pedersoli, E.; Sincrotrone Trieste, Trieste, ITALY Reich, C.; PNSensor GmbH, München, GERMANY Rolles, D.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Rudek, B.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für Kernphysik, Heidelberg, GERMANY Rudenko, A.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für Kernphysik, Heidelberg, GERMANY Schulz, J.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY; European XFEL GmbH, Hamburg, GERMANY Shoeman, R. L.; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Soltau, H.; PNSensor GmbH, München, GERMANY Starodub, D.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Steinbrener, J.; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Stellato, F.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Strüder, L.; Max-Planck-Institut Halbleiterlabor, München, GERMANY; Max-Planck-Institut für extraterrestrische Physik, Garching, GERMANY Ullrich, Joachim; Präsidium, P, PTB-Braunschweig; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für Kernphysik, Heidelberg, GERMANY Weidenspointner, G.; Max-Planck-Institut Halbleiterlabor, München, GERMANY; Max-Planck-Institut für extraterrestrische Physik, Garching, GERMANY White, T. A.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Wunderer, C. B.; Photon Science, DESY, Hamburg, GERMANY Barty, A.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY Schlichting, I.; Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Hamburg, GERMANY; Max-Planck-Institut für medizinische Forschung, Heidelberg, GERMANY Bogan, M. J.; SLAC National Accelerator Laboratory, Menlo Park, Calif., USA Chapman, H. N.; Center for Free-Electron Laser Science, DESY, Hamburg, GERMANY; University of Hamburg, Hamburg, GERMANY
Quelle/Jahr	Optics Express: 20 (2012), 12, 13501 - 13512
Availability	[online only]
ISSN	1094-4087
DOI	https://doi.org/10.1364/oe.20.013501
Verlag	Washington, DC: Optical Society of America
Klassifikationscode	OCIS: 110.7440 ; OCIS: 110.3010
Zusammenfassung	The emergence of femtosecond diffractive imaging with X-ray lasers has enabled pioneering structural studies of isolated particles, such as viruses, at nanometer length scales. However, the issue of missing low frequency data significantly limits the potential of X-ray lasers to reveal sub-nanometer details of micrometer-sized samples. We have developed a new technique of dark-field coherent diffractive imaging to simultaneously overcome the missing data issue and enable us to harness the unique contrast mechanisms available in dark-field microscopy. Images of airborne particulate matter (soot) up to two microns in length were obtained using single-shot diffraction patterns obtained at the Linac Coherent Light Source, four times the size of objects previously imaged in similar experiments. This technique opens the door to femtosecond diffractive imaging of a wide range of micrometer-sized materials that exhibit irreproducible complexity down to the nanoscale, including airborne particulate matter, small cells, bacteria and gold-labeled biological samples.

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Martin, A. V., Loh, N. D., Hampton, C. Y., Sierra, R. G., Wang, F., Aquila, A., Bajt, S., Barthelmess, M., Bostedt, C., Bozek, J. D., Coppola, N., Epp, S. W., Erk, B., Fleckenstein, H., Foucar, L., Frank, M., Graafsma, H., Gumprecht, L., Hartmann, A., Hartmann, R., Hauser, G., Hirsemann, H., Holl, P., Kassemeyer, S., Kimmel, N., Liang, M., Lomb, L., Maia, F. R. N. C., Marchesini, S., Nass, K., Pedersoli, E., Reich, C., Rolles, D., Rudek, B., Rudenko, A., Schulz, J., Shoeman, R. L., Soltau, H., Starodub, D., Steinbrener, J., Stellato, F., Strüder, L., Ullrich, J., Weidenspointner, G., White, T. A., Wunderer, C. B., Barty, A., Schlichting, I., Bogan, M. J., & Chapman, H. N. (2012). Femtosecond dark-field imaging with an X-ray free electron laser. Optics Express, 20(12), 13501–13512. https://doi.org/10.1364/oe.20.013501

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