| Zugriffsnummer | 28372 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Modeling of a sampling system based on Sigma-Delta ADC for data acquisition in metrology [poster] |
| Autor(in); Institution |
Iuzzolino, Ricardo; Instituto Nacional de Tecnología Industrial (INTI), San Martin, ARGENTINA
Palafox Gamir, Luis; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
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| Quelle/Jahr | 2012 Conference on Precision Electromagnetic Measurements digest:(2012), 536 - 537 |
| Availability | [CD-ROM] ; file name: 269.pdf |
| ISBN | 978-1-4673-0441-2 ; 978-1-4673-0439-9 |
| Verlag | Piscataway, NJ: IEEE Operations Center |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM), Washington, DC, 01-06, July, 2012, USA |
| Freie Schlagworte | Sigma-Delta data converters ; analog-digital conversion ; modeling ; model parameter identification ; Josephson voltage standard |
| Zusammenfassung | This paper describes the use of modeling to improve the accuracy of a sampling system built around a Sigma-Delta analog-to-digital converter. The parameters of the model were established using waveforms from a programmable Josephson array. The validation results have shown that the achievable accuracy is within 8 μV/V for signals in the frequency range up to 1.3 kHz at equivalent sampling rates below 32 kHz. |
