| Zugriffsnummer | 28113 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | AFM diagnostics of graphene-based quantum Hall devices |
| Autor(in); Institution |
Sikora, Andrzej; Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, POLAND
Woszczyna, Miroslaw; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Friedemann, Miriam; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Ahlers, Franz Josef; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Kalbac, Martin; J. Heyrovsky Institute of Physical Chemistry, Prague, CZECH REPUBLIC
|
| Quelle/Jahr | Micron: 43 (2012), 2/3, 479 - 486 |
| ISSN | 0968-4328 (PRINT) ; 1878-4291 (ONLINE) |
| DOI | |
| Verlag | Amsterdam [u.a.]: Elsevier Science |
| Freie Schlagworte | graphene ; quantum Hall effect devices ; atomic force microscopy ; Kelvin probe force microscopy ; Mechanical properties mapping ; thin films |
| Zusammenfassung | In this paper we present the results of morphological, mechanical and electrical investigation of the properties of prepared graphene flakes and graphene-based quantum Hall devices. AFM imaging allowed us to identify the local imperfections and unintentional modifications of the graphene sheets which had caused severe deterioration of the device electrical performance. Utilizing the NanoSwing imaging method, based on the time-resolved tapping mode, we could observe non-homogeneities of the structural and mechanical properties. We also diagnosed the device under working conditions by Kelvin probe microscopy and detected its local electric field distribution. |
