| Zugriffsnummer | 27768 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Direct numerical simulation of rough microcontacts under normal load |
| Autor(in); Institution |
Meeß, Rudolf; 5.5, Wissenschaftlicher Gerätebau, PTB-Braunschweig
Löffler, Frank; 5.5, Wissenschaftlicher Gerätebau, PTB-Braunschweig
|
| Quelle/Jahr | Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology: 1 (2012) |
| Herausgeber(in) |
Shore, Paul
|
| ISBN | 978-0-9566790-0-0 |
| Verlag | Bedford: Euspen |
| Konferenzangaben | EUSPEN International Conference, Stockholm, 04-08, June, 2012, Sweden |
| Zusammenfassung | The determination of the real contact area is important for many high-precision applications and measurements tasks. Microparts with radii of curvature of 100 μm, and less, show typical wavelengths for roughness, form and waviness, which go beyond the conventional scale. Hence, the proven contact models for the macroscopic case should be verified with respect to the geometric scale and material properties. The new approach presented here employs topographies from Atomic Force Microscope (AFM) measurements and circumvents micro-geometric models. The numerical simulation determines the deformation of the elastic half-space. Plastic deformation may occur locally on the surface. Novel models for the plastically deformed surface are introduced and compared. |
