Zugriffsnummer 27698
Dokumenttyp Zeitschriftenartikel
Peer Review unbekannt
Sprache Englisch
Titel Phase measurement of various commercial heterodyne He-Ne-laser interferometers with stability in the picometer regime
Autor(in); Institution
Köchert, Paul; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Flügge, Jens; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Weichert, Christoph; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Köning, Rainer; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Manske, Eberhard; TU Ilmenau, Ilmenau, GERMANY
Quelle/Jahr Measurement Science and Technology: 23 (2012), 7, 1 - 6
ISSN 0957-0233 (PRINT) ; 1361-6501
DOI
Verlag Bristol: IOP Publ.
Klassifikationscode PACS: 07.60.Ly ; PACS: 07.50.Qx ; PACS: 42.79.Bh ; PACS: 84.30.Sk
Freie Schlagworte phase meter ; lock-in principle ; FPGA ; heterodyne interferometry stability
Zusammenfassung In order to be able to resolve displacements of a picometer with widely used commercially available heterodyne interferometers, an advanced phase meter was developed at PTB. Key to this level of accuracy is the use of a state-of-the-art analogue-to-digital converter (ADC) board enabling the implementation of a phase-evaluation method by using embedded field programmable gate arrays. Experimental results obtained with commercially available heterodyne laser interferometer components prove that the proposed phase-evaluation procedure is capable of interpolating an optical fringe down into the picometer regime. The phase evaluation was moreover extended to track simultaneously two heterodyne beat frequencies with only two photodetectors and ADCs. Potential limitations of the long-term stability of heterodyne interferometers are discussed. The phase meter was tested, has been readily applied, can be easily adapted and is therefore to be used in a wide field of applications.

Zitierung

Köchert, P., Flügge, J., Weichert, C., Köning, R., & Manske, E. (2012). Phase measurement of various commercial heterodyne He-Ne-laser interferometers with stability in the picometer regime. Measurement Science and Technology, 23(7), 1–6. https://doi.org/10.1088/0957-0233/23/7/074005

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