| Zugriffsnummer | 27307 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | An investigation of nanostructures produced by using a scanning tunneling microscope |
| Autor(in); Institution |
Köning, Rainer; 5.101, Rastersondenmikroskopie an quasiperfekten Oberflächen, PTB-Braunschweig
Jusko, Otto; 5.13, Mikrostrukturmeßsysteme, PTB-Braunschweig
Koenders, Ludger; 5.101, Rastersondenmikroskopie an quasiperfekten Oberflächen, PTB-Braunschweig
|
| Quelle/Jahr | International progress in precision engineering : proceedings of the 8th International Precision Engineering Seminar:(1995), 203 - 206 |
| Herausgeber(in) |
Bonis, Marc
|
| ISBN | 0-444-10000-8 |
| Verlag | Amsterdam [u.a.]: Elsevier |
| Konferenzangaben | 8th International Precision Engineering Seminar - IPES 8, Compiègne, 15-19, May, 1995, France |
| Zusammenfassung | Scanning tunneling measurements on clean Si(111) surfaces were made to analyze the influence of parameters such as tunneling current and tip quality on surface topography. For this tips of different materials (W, Au, Pt90/Ir10 and Be) were used. The experimental results found could be explained by the theory of Tersoff and Haman. Further we have investigated STM topography profiles by numerically solving Schrödinger's equitation for square-well-potential confined sample and different tip geometries. Especially, surface steps, triangular shaped hills and trenches as well as rectangular grooves have been studied using various tip radii and angles. Relations to real image-falsification effects in the experiment will be discussed. |
