| Zugriffsnummer | 26342 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Diameter comparison of a silicon sphere for the International Avogadro Coordination project |
| Autor(in); Institution |
Kuramoto, Naoki; National Metrology Institute of Japan (NMIJ), AIST, Tsukuba, JAPAN
Fujii, Kenichi; National Metrology Institute of Japan (NMIJ), AIST, Tsukuba, JAPAN
Nicolaus, Arnold; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Bartl, Guido; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Gray, Malcolm; National Measurement Institute (NMIA), Lindfield,NSW, AUSTRALIA
Manson, Peter; National Measurement Institute (NMIA), Lindfield, NSW, AUSTRALIA
Giardini, Walter; National Measurement Institute (NMIA), Lindfield, NSW, AUSTRALIA
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 60 (2011), 7, 2615 - 2620 |
| ISSN | 0018-9456 |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | 2010 Conference on Precision Electromagnetic Measurements, Daejeon, 13-18, June, 2010, South Korea |
| Freie Schlagworte | silicon spheres ; Avogadro constant ; diameter comparison |
| Zusammenfassung | In the International Avogadro Coordination (IAC) Project using the x-ray crystal density method, volume measurements of silicon spheres by optical interferometry play a crucial role for the density measurement of the 28Si enriched crystal. To confirm the reliability of the volume measurement, specified diameters of a silicon sphere were measured independently by optical interferometers at PTB (Germany), NMIA (Australia) and NMIJ (Japan). The sphere was washed before the measurement with the same procedure. The directions of the diameters were identified with reference marks prepared on the surface of the sphere. Details on the comparison results are presented. |
Zitierung
Kuramoto, N., Fujii, K., Nicolaus, A., Bartl, G., Gray, M., Manson, P., & Giardini, W. (2011). Diameter comparison of a silicon sphere for the International Avogadro Coordination project. IEEE Transactions on Instrumentation and Measurement, 60(7), 2615–2620. https://doi.org/10.1109/tim.2010.2099272