| Zugriffsnummer | 25960 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | The isotopic composition of enriched Si: a data analysis |
| Autor(in); Institution |
Bulska, E.; University of Warsaw, Faculty of Chemistry, Warsaw, POLAND
Drozdov, M. N.; Russian Academy of Sciences, Institute for Physics of Microstructures (IPM-RAS), Nishny Novgorod, RUSSIA
Mana, G.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Pramann, Axel; 3.1, Metrologie in der Chemie, PTB-Braunschweig
Rienitz, Olaf; 3.1, Metrologie in der Chemie, PTB-Braunschweig
Sennikov, P. G.; Institute of Chemistry of HighRussian Academy of Sciences, Institute of High Purity Substance Chemistry (IChHPS-RAS), Nishny Novgorod, RUSSIA
Valkiers, S.; Institute for Reference Materials and Measurement (IRMM), Geel, BELGIUM
|
| Quelle/Jahr | Metrologia: 48 (2011), 2, S32 - S36 |
| ISSN | 0026-1394 |
| DOI | |
| URL | |
| Verlag | Bristol [u.a.]: IOP [u.a.] |
| Klassifikationscode | PACS: 06.20.Jr ; PACS: 82.80.Ms |
| Freie Schlagworte | instrumentation ; measurement ; chemical physics ; physical chemistry |
| Zusammenfassung | To determine the Avogadro constant by counting the atoms in quasi-perfect spheres made of a silicon crystal highly enriched with 28Si, the isotopic composition of the crystal was measured in different laboratories by different measurement methods. This paper examines the consistency of the measurement results. |
