| Zugriffsnummer | 25670 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Optoelectronic phase delay measurement for a modified Michelson interferometer |
| Autor(in); Institution |
Bruns, Thomas; 1.7, Akustik und Dynamik, PTB-Braunschweig
Blume, Frank; 1.7, Akustik und Dynamik, PTB-Braunschweig
Baaske, Kai; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Volkers, Henrik; 1.7, Akustik und Dynamik, PTB-Braunschweig
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| Quelle/Jahr | IMEKO TC3 & TC5 & TC22 International Conference:(2010), 237 - 239 |
| Availability | [CD-ROM] ; file name: Proceedings of IMEKO 2010 TC3, TC5, TC22 conference.pdf |
| URL | |
| Verlag | Klong Luang, Pathumthani: National Institute of Metrology |
| Konferenzangaben | IMEKO 2010: TC3, TC5 and TC22 Conferences, Pattaya, 21-25, November, 2010, Thailand |
| Freie Schlagworte | phase response ; laser interferometer ; response time |
| Zusammenfassung | For the primary calibration of the phase response of accelerometers, the knowledge of the response delay of the reference, i.e. the laser interferometer is a decisive prerequisite. However, an experimental determination of the interferometric response time is not a simple task. This contribution describes an opto-electronic set-up based on a femtosecond laser and originally developed for calibration of high speed sampling oscilloscopes, which enables a precise determination of the intrinsic delay of the photo detectors of a modified Michelson interferometer used at PTB. |
