| Zugriffsnummer | 25095 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Comparative surface investigations at spherical Si surfaces using optical and X-ray techniques |
| Autor(in); Institution |
Busch, Ingo; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Fuchs, Peter; Metrologie und Akkreditierung Schweiz (METAS), Bern-Wabern, SWITZERLAND
Krumrey, Michael; 7.1, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Kuetgens, Ulrich; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
|
| Quelle/Jahr | 2010 Conference on Precision Electromagnetic Measurements digest:(2010), 494 - 495 |
| Availability | [CD-ROM] ; file name: Busch_CPEM2010.pdf |
| Herausgeber(in) |
Song, Yang Sup
|
| ISBN | 978-1-4244-6795-2 (print) ; 978-1-424-46796-9 (CD-ROM) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE Operations Center |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM), 2010, Daejeon, 13-18 June, 2010, South Korea |
| Zusammenfassung | Currently options for a new definition of the kilogram on the basis of invariants of nature are under investigations. One of the most promising approaches uses the mass of 12C. Within the framework of the Avogadro project the scaling factor between atomic mass units and macroscopic mass, the Avogadro constant NA, will be measured with a relative standard uncertainty 2·108, to enable this type of realization. |
Zitierung
Busch, I., Fuchs, P., Krumrey, M., & Kuetgens, U. (2010). Comparative surface investigations at spherical Si surfaces using optical and X-ray techniques. Conference on Precision Electromagnetic Measurements (CPEM), 2010, Daejeon, 13-18 June, 2010, South Korea. https://doi.org/10.1109/cpem.2010.5543604