Zugriffsnummer 25034
Dokumenttyp Konferenzartikel in Zeitschrift
Peer Review unbekannt
Sprache Englisch
Titel Investigation of low-frequency excess flux noise in dc SQUIDs at mK temperatures
Autor(in); Institution
Drung, Dietmar; 7.5, Kryo- und Vakuumphysik, PTB-Berlin
Beyer, Jörn; 7.5, Kryo- und Vakuumphysik, PTB-Berlin
Storm, Jan-Hendrik; 7.5, Kryo- und Vakuumphysik, PTB-Berlin
Peters, Margret; 7.5, Kryo- und Vakuumphysik, PTB-Berlin
Schurig, Thomas; 7.5, Kryo- und Vakuumphysik, PTB-Berlin
Quelle/Jahr IEEE Transactions on Applied Superconductivity: 21 (2011), 3, 340 -  344
ISSN 1051-8223
DOI
Verlag New York: IEEE
Konferenzangaben Applied Superconductivity Conference, Washington, D.C., 01-06, August, 2010, USA
Freie Schlagworte flux noise ; Energy resolution ; SQUID current sensor ; ultra-low temperature
Zusammenfassung The excess low-frequency flux noise in dc superconducting quantum interference devices (SQUIDs) operated at ultra-low temperatures was studied. A large number of single SQUIDs as well as SQUID arrays from 16 wafers fabricated over a period of six years were characterized at 4.2 K and (320 mK. Considering the large spread in the low-frequency noise at 4.2 K, there was no observable dependence of the low-frequency energy resolution ε1/ƒ on the SQUID design or fabrication parameters. In contrast, below 4.2 K the low-frequency noise changed moderately or increased strongly depending on whether the bottom Nb or the insulation layer were fabricated in our newer sputter system instead of the older one. The corresponding excess noise levels ε1/ƒ at (320 mK and f = 10 Hz are typically 40 h and 300 h, respectively (h is Planck’s constant). The excess noise scales as ε1/ƒ varies ƒ -α with α typically around 0.6 for good devices. For devices with strong low-frequency excess noise,  α increases up to about 0.9. The best energy resolution ε achieved so far with a 50 pH test SQUID operated at 16 mK is 0.62 h at 100 kHz, increasing to 1.64 h at 1 kHz and 14 h at 10 Hz.

Zitierung

Drung, D., Beyer, J., Storm, J.-H., Peters, M., & Schurig, T. (2011). Investigation of low-frequency excess flux noise in dc SQUIDs at mK temperatures. IEEE Transactions on Applied Superconductivity, 21(3), 340– 344. https://doi.org/10.1109/tasc.2010.2084054

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