Zugriffsnummer 24964
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Investigations on model-based uncertainties for the reconstruction of 2D periodic surface profiles in scatterometry
Autor(in); Institution
Gross, Hermann; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Henn, Mark-Alexander; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Rathsfeld, Andreas; Weierstrass Institute for Applied Analysis and Stochastics, Berlin, GERMANY
Scholze, Frank; 7.2, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Bodermann, Bernd; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Bär, Markus; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Quelle/Jahr EOS Topical Meeting on Diffractive Optics 2010:(2010), 2 S.
Availability [CD-ROM] ; file name: Koli Gross Hermann 2483.pdf
ISBN 978-3-00-024193-2
Verlag [Hannover]: European Optical Society (EOS)
Konferenzangaben 7th EOS Topical Meeting on Diffractive Optics 2010, Koli, 14-18, February, 2010, Finland
Freie Schlagworte Scatterometry ; Diffractive Optics ; Modelling
Zusammenfassung We report on modeling and uncertainty estimates for the evaluation of measurements in scatterometry, i.e., the determination of periodic surface structures from light diffraction patterns.

Zitierung

Gross, H., Henn, M.-A., Rathsfeld, A., Scholze, F., Bodermann, B., & Bär, M. (2010). Investigations on model-based uncertainties for the reconstruction of 2D periodic surface profiles in scatterometry. 7th EOS Topical Meeting on Diffractive Optics 2010, Koli, 14-18, February, 2010, Finland.

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