| Zugriffsnummer | 24930 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films |
| Autor(in); Institution |
Krämer, Markus; Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., Dortmund, GERMANY; AXO DRESDEN GmbH, Dresden, GERMANY
Roodenko, Katy; Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., Department Berlin, Berlin, GERMANY; Laboratory for Surface and Nanostructure Modification, University of Texas at Dallas - NSERL Richardson, TX, USA
Pollakowski, Beatrix; 7.1, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Hinrichs, Karsten; Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., Department Berlin, Berlin, GERMANY
Rappich, Jörg; Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Abteilung Silizium-Photovoltaik, Berlin, GERMANY
Esser, Norbert; Leibniz-Institut für Analytische Wissenschaften—ISAS—e.V.—Department Berlin, Berlin, GERMANY
Bohlen, Alex von; Leibniz-Institut für Analytische Wissenschaften—ISAS—e.V., Dortmund, GERMANY; AXO DRESDEN GmbH, Dresden, GERMANY
Hergenröder, Roland; Leibniz-Institut für Analytische Wissenschaften—ISAS—e.V., Dortmund, GERMANY; AXO DRESDEN GmbH, Dresden, GERMANY
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| Quelle/Jahr | Thin Solid Films: 518 (2010), 19, 5509 - 5514 |
| ISSN | 0040-6090 |
| DOI | |
| Verlag | Amsterdam [u.a.]: Elsevier |
| Freie Schlagworte | Optical simulations ; Infrared spectroscopic ellipsometry ; Synchrotron ; X-ray standing waves ; Surface modification |
| Zusammenfassung | Ultrathin nanocomposite films of nitrobenzene on silicon were analyzed by Infrared Spectroscopic Ellipsometry (IRSE), X-ray reflectivity (XRR) and X-ray standing waves (XSW) before and after evaporation of gold. Infrared Spectroscopic Ellipsometry measurements were performed for identification of adsorbates and for investigation of the molecular orientation. Results for film thickness were correlated with XRR measurements. Further, XSW measurements of elements incorporated in nitrobenzene (C, N, and O) were performed with soft X-rays. The combination of the different methods allowed to confirm a model for the electrochemically deposited nitrobenzene films before and after gold evaporation. The characterization by XRR and XSW scans using hard X-rays showed that gold had penetrated into the nitrobenzene film and thus changed density and optical properties of this layer significantly. A depth profile correlated to the electrondensity is deduced from the XRR measurements. This profile allows to localize - in vertical direction - gold islands within the composite film. |
Zitierung
Krämer, M., Roodenko, K., Pollakowski, B., Hinrichs, K., Rappich, J., Esser, N., Bohlen, A. V., & Hergenröder, R. (2010). Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films. Thin Solid Films, 518(19), 5509–5514. https://doi.org/10.1016/j.tsf.2010.04.033