| Zugriffsnummer | 24924 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Status of the NA determination by counting atoms in silicon crystals |
| Autor(in); Institution |
Becker, Peter; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
Bettin, Horst; 3.2, Gasanalytik und Zustandsverhalten, PTB-Braunschweig
Borys, Michael; 1.1, Masse, PTB-Braunschweig
Busch, Ingo; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Fujii, K.; National Metrology Institute of Japan (NMIJ), Tsukuba, JAPAN
Gray, M.; National Measurement Institute (NMI), Lindfield, NSW, AUSTRALIA
Krumrey, Michael; 7.1, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Kuetgens, Ulrich; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
Mana, G.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Manson, P.; National Measurement Institute (NMI), Lindfield, NSW, AUSTRALIA
Massa, A.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Nicolaus, Arnold; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Picard, A.; Bureau International des Poids et Mesures (BIPM), Sèvres, FRANCE
Schiel, Detlef; 3.1, Metrologie in der Chemie, PTB-Braunschweig
Valkiers, S.; Institute for Reference Materials and Measurements, Geel, BELGIUM
|
| Quelle/Jahr | 2010 Conference on Precision Electromagnetic Measurements digest:(2010), 107 - 108 |
| Herausgeber(in) |
Song, Yang Sup
|
| ISBN | 978-1-424-46794-5 (print) ; 978-1-424-46796-9 (CD-ROM) |
| Verlag | Piscataway, NJ: IEEE Operations Center |
| Konferenzangaben | Conference on precision electromagnetic measurements (CPEM) 2010, Daejeon, 13-18, June, 2010, South Korea |
| Zusammenfassung | The paper reports the progress and the achievements of an international research project aimed at determining the Avogadro constant by counting the atoms in enriched 28Si spheres. |
Zitierung
Becker, P., Bettin, H., Borys, M., Busch, I., Fujii, K., Gray, M., Krumrey, M., Kuetgens, U., Mana, G., Manson, P., Massa, A., Nicolaus, A., Picard, A., Schiel, D., & Valkiers, S. (2010). Status of the NA determination by counting atoms in silicon crystals. Conference on precision electromagnetic measurements (CPEM) 2010, Daejeon, 13-18, June, 2010, South Korea.