Zugriffsnummer 24916
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel An optical microform calibration system for ball-shaped hardness indenters
Autor(in); Institution
Li, Zhi; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Gao, Sai; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Herrmann, Konrad; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Quelle/Jahr Optical micro- and nanometrology III:(2010), 77181C-1 - 77181C-8
Schriftenreihe Proceedings of SPIE: 7718
Herausgeber(in)
Gorecki, Christophe
ISBN 978-0-8194-8191-7
DOI
Verlag Bellingham, Wash.: SPIE
Konferenzangaben Conference on Optical Micro- and Nanometrology III, Brussels, 13-16, April, 2010, Belgium
Freie Schlagworte microform calibration ; confocal microscope ; micro- and nanoindentation ; indenter ; Rockwell indenter ; ballshaped indenter ; radius measurement ; spherical surface
Zusammenfassung Accurate measurement of the mechanical properties of materials with micro-/nanoindentation methods demands precise knowledge of tip geometry of the indenters in use. An optical microform calibration system for ball-shaped indenters, and Rockwell indenter in particular, is therefore developed in Physikalisch-Technische Bundesanstalt. The calibration system is fundamentally realized on basis of an optical confocal microscope. By means of investigating the spherical aberration introduced by the object under test, the calibration system has the capability to quantitatively determine the averaging radius of a spherical body (up to 300 μm) with an uncertainty of .appr. 6 × 10-3. To apply the calibration system for characterization of a partial spherical object, e.g. a Rockwell indenter, a simple method has been proposed to improve the possible resolution of the calibration system. The basic configuration of the calibration system and preliminary experimental results are detailed in this paper. Further extension of the functionality of the calibration system is outlined.

Zitierung

Li, Z., Gao, S., & Herrmann, K. (2010). An optical microform calibration system for ball-shaped hardness indenters. Conference on Optical Micro- and Nanometrology III, Brussels, 13-16, April, 2010, Belgium. https://doi.org/10.1117/12.854800

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