Zugriffsnummer 24764
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Highly sensitive beam size monitor for pA currents at the MLS Electron Storage Ring
Autor(in); Institution
Koschitzki, Christian; 7.2, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Hoehl, Arne; 7.2, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Klein, Roman; 7.2, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Thornagel, Reiner; 7.2, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Feikes, J.; Helmholtz-Zentrum Berlin GmbH, Berlin, GERMANY
Hartrott, M. v.; Helmholtz-Zentrum Berlin GmbH, Berlin, GERMANY
Wüstefeld, G.; Helmholtz-Zentrum Berlin GmbH, Berlin, GERMANY
Quelle/Jahr IPAC 2010 : Contributions to the Proceedings:(2010), 894 - 896
ISBN 978-92-9083-352-9
Konferenzangaben The 1st International Particle Accelerator Conference, Kyoto, May 23-28, 2010, Japan
Zusammenfassung For the operation of the Metrology Light Source (MLS), the electron storage ring of the Physikalisch-Technische Bundesanstalt (PTB), as a primary radiation source standard all storage ring parameters have to be known absolutely. For the measurement of the electron beam size and the control of the stability of the orbit locationa new imaging system has been set up, that operates at very different intensity levels covering more than 11 decades, given by the variation of the electron beam current. The system uses a commercial zoom lens for the achromatic optical imaging of the electron beam source point onto two different camera systems. One camera system is for life-imaging of the source point at electron beam currents from 200 mA down to some μA. The second system is a cooled CCD-camera that allows imaging of the electron beam source size and location at very low currents, down to only one stored electron.

Zitierung

Koschitzki, C., Hoehl, A., Klein, R., Thornagel, R., Feikes, J., Hartrott, M. V., & Wüstefeld, G. (2010). Highly sensitive beam size monitor for pA currents at the MLS Electron Storage Ring. The 1st International Particle Accelerator Conference, Kyoto, May 23-28, 2010, Japan.

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