| Zugriffsnummer | 23957 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Design and characterization of a sampling system based on a Σ-Δ analog-to-digital converter for electrical metrology |
| Autor(in); Institution |
Iuzzolino, Ricardo; Instituto Nacional de Tecnología Industrial (INTI), Buenos Aires, ARGENTINA
Palafox Gamir, Luis; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Kürten Ihlenfeld, Waldemar Guilherme; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Brendel, Christian; TU Braunschweig, Institut für Elektrische Messtechnik und Grundlagen der Elektronik, Braunschweig, GERMANY
Mohns, Enrico; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 58 (2009), 4, 786 - 790 |
| ISSN | 0018-9456 |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM), Broomfield, Colorado, 08-13, June, 2008, USA |
| Freie Schlagworte | Sampling Techniques ; Complex Programmable Logic Device ; Universal Serial Bus ; Analog-to-Digital Conversion ; Josephson waveform synthesizer (JWS) ; sigma-delta analog-to-digital converters (ADCs) ; sigma-delta modulation |
| Zusammenfassung | This paper describes a sampling system designed using a commercial sigma-delta analog-to-digital converter (Sigma-Delta ADC). In addition to characterization measurements using a conventional high-quality signal generator, a Josephson waveform synthesizer that provides ultimately noise- and drift-free voltages was used. To evaluate the suitability of this sampling system as part of a transfer power standard, additional comparisons of the root-mean-square (RMS) values measured were performed against a thermal converter and the primary power sampling standard at the Physikalisch-Technische Bundesanstalt, Braunschweig, Germany. Initial analysis of the measurement data shows an effective resolution in the range of 18-19 bits at an equivalent sampling rate of 64 kHz. The integral nonlinearity error of the system was measured to be within ± 7 μV/V or one least significant bit at this resolution. |
Zitierung
Iuzzolino, R., Palafox Gamir, L., Kürten Ihlenfeld, W. G., Brendel, C., & Mohns, E. (2009). Design and characterization of a sampling system based on a Σ-Δ analog-to-digital converter for electrical metrology. IEEE Transactions on Instrumentation and Measurement, 58(4), 786–790. https://doi.org/10.1109/tim.2008.2010575