| Zugriffsnummer | 23154 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Establishing uncertainties for on-wafer S-parameter measurements |
| Autor(in); Institution |
Leinhos, Jens; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | GeMiC 2008 : German Microwave Conference:(2008), 439 - 441 |
| Schriftenreihe | ITG-Fachbericht: 206 |
| Availability | [CD-ROM] ; file name: 7c04.pdf |
| Herausgeber(in) |
Jacob, Arne
|
| ISBN | 978-3-8007-3086-5 |
| Verlag | Berlin [u.a.]: VDE-Verl. |
| Konferenzangaben | GeMiC 2008 - German Microwave Conference, Hamburg, 10-12, March, 2008, Germany |
| Zusammenfassung | Although on-wafer high-frequency measurements are nowadays commonly used, uncertainties for scattering parameter measurements in planar transmission lines are still not yet established - a problem which has been long solved in coaxial lines and waveguides. We describe a GUM-compliant approach that is capable of providing a traceability path for on-wafer measurements up to 50 GHz using the TRL calibration algorithm. |
