| Zugriffsnummer | 23142 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations |
| Autor(in); Institution |
Leinhos, Jens; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 2008 IEEE MTT-S International Microwave Symposium digest:(2008), 33 - 36 |
| Availability | [CD-ROM] ; file name: [IMS2008]27-IC7P7OTfGvQk.pdf |
| ISBN | 978-1-4244-1781-0 |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 71st ARFTG Microwave Measurements Conference, Atlanta, GA, 20, June, 2008, USA |
| Zusammenfassung | Although on-wafer high-frequency measurements are nowadays commonly used, uncertainties for scatteringparameter measurements in planar transmission lines are still not yet established - a problem which has been long solved in coaxial lines and waveguides. We describe a GUM-compliant approach that is capable of providing a traceability path for on-wafer measurements up to 50 GHz using the TRL calibration algorithm. |
