| Zugriffsnummer | 22792 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Appearance characterisation of reference materials for reflectometry : measurement of the reflection indicatrix |
| Autor(in); Institution |
Höpe, Andreas; 4.5, Optische Technologien, PTB-Braunschweig
Teichert, Sven; 4.5, Optische Technologien, PTB-Braunschweig
Hauer, Kai-Olaf; 4.5, Optische Technologien, PTB-Braunschweig
|
| Quelle/Jahr | Proceedings of NEWRAD 2008 : 10th International Conference on New Developments and Applications in Optical Radiometry:(2008), 225 - 226 |
| Verlag | Daejeon: KRISS |
| Konferenzangaben | 10th International Conference on New Developments and Applications in Optical Radiometry, Daejeon, 13-16, October, 2008, Korea |
| Zusammenfassung | Diffuse reflection standards are widely used in ra-diometry and photometry for referencing commercial measurement equipment, like colorimeters and spectrophotometers to an absolute reflection scale. The basis for the measurand radiance factor is the concept of the perfectly reflecting diffuser (PRD). The PRD is a theoretical concept only, which cannot be realised materially. Since there is no material with these characteristics, the realisation is carried out with physical methods, i.e. by the measuring apparatus itself, in the context of an absolute measurement. For practical purposes reflection measurements are accomplished predominantly relative to commercial available reflection standards. In this investigation different widely used diffuse reflection materials were measured in multigeometry configurations on a gonioreflectometer in order to characterize their three-dimensional reflection behaviour. For fixed incident angles the full hemispherical reflection indicatrix was determined. |
Zitierung
Höpe, A., Teichert, S., & Hauer, K.-O. (2008). Appearance characterisation of reference materials for reflectometry : measurement of the reflection indicatrix. 10th International Conference on New Developments and Applications in Optical Radiometry, Daejeon, 13-16, October, 2008, Korea.