| Zugriffsnummer | 22161 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Advances in measurement technology and intelligent instruments for production engineering |
| Quelle/Jahr | Measurement Science and Technology: 19 (2008), 8, 080101-1 - 080101-2 |
| Herausgeber(in) |
Gao, Wei; Tohoku University, Department of Nanomechanics, Sendai, Japan
Takaya, Yasuhiro; Osaka University, Department of Mechanical Engineering, Osaka, JAPAN
Gao, Yongsheng; Hong Kong University of Science and Technology, Kowloon, HONGKONG
Krystek, Michael; 5, Fertigungsmesstechnik, PTB-Braunschweig
|
| ISSN | 0957-0233 (PRINT) |
| DOI | |
| Verlag | Bristol: IOP Publishing Ltd. |
| Konferenzangaben | ISMTII 2007, 8th International Symposium on Measurement Technology and Intelligent Instruments, Sendai, 24-27, September, 2007, Japan |
| Freie Schlagworte | Measurement ; Instrumentation ; Micro/nano metrology ; Precision measurement ; Surface metrology ; Optical Metrology ; Uncertainty ; Traceability ; Signal processing |
| Zusammenfassung | Measurement and instrumentation have long played an important role in Production Engineering, through supporting both the traditional field of manufacturing and the new field of micro/nano-technology. Papers published in this special feature were selected and updated from those presented at the symposium. |
