| Zugriffsnummer | 21859 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | THz Metrology |
| Autor(in); Institution |
Kleine-Ostmann, Thomas; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Schrader, Thorsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Siegner, Uwe; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Monte, Christian; 7.3, Hochtemperatur- und Vakuumphysik, PTB-Berlin
Gutschwager, Berndt; 7.3, Hochtemperatur- und Vakuumphysik, PTB-Berlin
Hollandt, Jörg; 7.3, Hochtemperatur- und Vakuumphysik, PTB-Berlin
Steiger, Andreas; 7.2, Detektorradiometrie, PTB-Berlin
Werner, Lutz; 7.2, Detektorradiometrie, PTB-Berlin
Müller, Ralph; 7.1, Photonenradiometrie, PTB-Berlin
Ulm, Gerhard; 7.1, Photonenradiometrie, PTB-Berlin
Pupeza, I.; Institut für Hochfrequenztechnik, TU Braunschweig, GERMANY
Koch, M.; Institut für Hochfrequenztechnik, TU Braunschweig, GERMANY
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| Quelle/Jahr | Frequenz: 62 (2008), 5/6, 137 - 148 |
| ISSN | 0016-1136 |
| DOI | |
| Verlag | Berlin: Schiele & Schön |
| Freie Schlagworte | terahertz metrology ; sub-mm waves ; traceability ; calibration ; THz-time-domain spectroscopy |
| Zusammenfassung | The frequenzy range between 100 GHz and a few THz has been used in fundamental research for many years. However, due to the lack of compact and bright sources there has long been a gap in commercial applications using THz radiation. In recent years, the advent of new optoelectronic generation and detection schemes as well as new technologies for integrated mm-ware components has led to first commercial applications. Still, the question how to measure power, power density, waveforms and material parameters accurately at sub-mm wavelengths remains unsolved. Today, the National Metrology Institutes are faced with a number of metrological challenges that need to be solved in order to help this new technology become marketable. |
| Innovationscluster | Umwelt und Klima |