| Zugriffsnummer | 21177 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation |
| Autor(in); Institution |
Gottwald, Alexander; 7.1, Photonenradiometrie, PTB-Berlin
Bridou, Françoise; Université Paris Sud, Laboratoire Charles Fabry de l’Institut d’Optique, Paris, FRANCE
Cuniot-Ponsard, Mireille; Université Paris Sud, Laboratoire Charles Fabry de l’Institut d’Optique, Paris, FRANCE
Desvignes, Jean-Michel; Université Paris Sud, Laboratoire Charles Fabry de l’Institut d’Optique, Paris, FRANCE
Kroth, Simone; 7.1, Photonenradiometrie, PTB-Berlin
Kroth, Udo; 7.1, Photonenradiometrie, PTB-Berlin
Paustian, Wolfgang; 7.1, Photonenradiometrie, PTB-Berlin
Richter, Mathias; 7.1, Photonenradiometrie, PTB-Berlin
Schöppe, Hendrik; 7.1, Photonenradiometrie, PTB-Berlin
Thornagel, Reiner; 7.1, Photonenradiometrie, PTB-Berlin
|
| Quelle/Jahr | Applied optics: 46 (2007), 32, 7797 - 7804 |
| ISSN | 0003-6935 |
| DOI | |
| URL | |
| Verlag | Washington, DC: Optical Society of America |
| Klassifikationscode | OCIS: 120.3940 ; OCIS: 120.5700 ; OCIS: 120.5410 ; OCIS: 260.7210 ; OCIS: 340.6720 |
| Zusammenfassung | In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the Berlin electron-storage ring BESSY II, a procedure has been developed to investigate the dependence of vacuum-ultraviolet reflection on polarization. It is based on characterizing the elliptically polarized synchrotron radiation at PTB’s normalincidence monochromator beamline for reflectometry by means of polarization-sensitive photodetectors. For this purpose, the polarization dependency in the detector responsivity was determined at a small, low, solid angle of acceptance for the synchrotron radiation, i.e., within the orbital plane of the storage ring where the degree of linear polarization is known to be almost 100 %. Our method allows the polarization dependence of reflection samples to be measured with relative standard uncertainties ranging from 2.4 % to 11 % in the spectral range between 60 and 160 nm. The method has been applied to the optimization of polarizing mirrors at the Lyman-α wavelength of 121.6 nm. |
Zitierung
Gottwald, A., Bridou, F., Cuniot-Ponsard, M., Desvignes, J.-M., Kroth, S., Kroth, U., Paustian, W., Richter, M., Schöppe, H., & Thornagel, R. (2007). Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation. Applied optics, 46(32), 7797–7804. https://doi.org/10.1364/ao.46.007797