Zugriffsnummer 20896
Dokumenttyp Konferenzartikel in Zeitschrift
Sprache Englisch
Titel Josephson series arrays for programmable 10-V SINIS Josephson voltage standards and for Josephson arbitrary waveform synthesizers based on SNS junctions
Autor(in); Institution
Kohlmann, Johannes; 2.4, Quantenelektronik, PTB-Braunschweig
Müller, Franz; 2.4, Quantenelektronik, PTB-Braunschweig
Kieler, Oliver; 2.4, Quantenelektronik, PTB-Braunschweig
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Palafox Gamir, Luis; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Kahmann, Martin; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Niemeyer, Jürgen; 2.4, Quantenelektronik, PTB-Braunschweig
Quelle/Jahr IEEE Transactions on Instrumentation and Measurement: 56 (2007), 2, 472 - 475
ISSN 0018-9456
DOI
Verlag New York, NY: IEEE
Konferenzangaben 2006 Conference on Precision Electromagnetic Measurements, Torino, 9-14, July, 2006, Italy
Freie Schlagworte Josephson Arbitrary Waveform Synthesizer ; programmable Josephson voltage standards ; SINIS and SNS Josephson junctions
Zusammenfassung Programmable Josephson voltage standards for output voltages up to 10 V have been realized. Binary-divided series arrays consisting of 69 632 overdamped SINIS Josephson junctions have been fabricated using reliable Nb-Al/Al2O3 technology (S : Superconductor, I : Insulator, N : Normal metal). Series arrays of about 1000 SNS Josephson junctions were realized as lumped arrays for applications in the Josephson Arbitrary Waveform Synthesizer (JAWS). We suggest a novel scheme for combining the higher voltages generated by the binary-divided arrays with the frequency spectral characteristics of the JAWS, in order to optimize the frequency spectrum of the generated ac voltages.

Zitierung

Kohlmann, J., Müller, F., Kieler, O., Behr, R., Palafox Gamir, L., Kahmann, M., & Niemeyer, J. (2007). Josephson series arrays for programmable 10-V SINIS Josephson voltage standards and for Josephson arbitrary waveform synthesizers based on SNS junctions. IEEE Transactions on Instrumentation and Measurement, 56(2), 472–475. https://doi.org/10.1109/tim.2007.891077

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