| Zugriffsnummer | 20569 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Entrance into the nano world with student kits for scanning probe microscopes |
| Autor(in); Institution |
Wilkening, Günter; 5, Fertigungsmesstechnik, PTB-Braunschweig; CC UPOB Geschäftsstelle Kompetenzzentrum Ultrapräzise Oberflächen e.V., Braunschweig, GERMANY
Koenders, Ludger; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig
Wolff, Helmut; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig
Brand, Uwe; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig; CC UPOB Geschäftsstelle Kompetenzzentrum Ultrapräzise Oberflächen e.V., Braunschweig, GERMANY
Klawitter, Heiko; 5, Fertigungsmesstechnik, PTB-Braunschweig; CC UPOB Geschäftsstelle Kompetenzzentrum Ultrapräzise Oberflächen e.V., Braunschweig, GERMANY
|
| Quelle/Jahr | Proceedings of the 7th international conference, European Society for Precision Engineering and Nanotechnology : May 20th - May 24th 2007, Bremen, Germany: 2 (2007), 546 - 549 |
| Herausgeber(in) |
Thornett, E.
|
| ISBN | 0-9553082-2-4 ; 978-0-9553082-2-2 |
| Verlag | Bedford: Euspen |
| Konferenzangaben | 7th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 20-24, May, 2007, UK |
| Freie Schlagworte | Student Kit ; Scanning tunneling microscope ; Scanning force microscope ; Nanotechnology competence center ; Ultra-precise surface figuring (cc UPOB) |
| Zusammenfassung | A student kit for a scanning tunneling microscope (STM) originally developed at the University of Münster (Germany) was further developed and mainly sold to schools in the region of Braunschweig. On the basis of these experiences a student kit for a scanning force microscope is under development. It will allow measurements not only on conducting surfaces, like the STM does, but even allows measurements on living cells. Heart of the kit is the low-budget cantilever which can be fabricated by the students itself. |
Zitierung
Wilkening, G., Koenders, L., Wolff, H., Brand, U., & Klawitter, H. (2007). Entrance into the nano world with student kits for scanning probe microscopes. 7th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 20-24, May, 2007, UK.