| Zugriffsnummer | 20159 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Uncertainties of VNA S-parameter measurements applying the TAN self-calibration method |
| Autor(in); Institution |
Stumper, Ulrich; 2.2, Hochfrequenz und Felder, PTB-Braunschweig; PTB-Braunschweig, retired staff
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 56 (2007), 2, 597 - 600 |
| ISSN | 0018-9456 |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | 2006 Conference on Precision Electromagnetic Measurements, Torino, 09-14, July, 2006, Italy |
| Freie Schlagworte | Scattering parameters ; sensitivity coefficients ; seven-term through-attenuator-network calibration ; through-reflect-line calibration ; through-reflect-match calibration ; vector network analyzer |
| Zusammenfassung | For the seven-term general through-attenuator-network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through-line-network, through-reflect-line, through-reflect-match, through-attenuator-reflect, or through-match-network, expressions for the deviations of the measured S-parameters of two-port test objects (device under test) from their true values, which are caused by deviations of the S-parameters of nonideal calibration elements (“standards”) from their ideal values, are presented. These sensitivity coefficients can be used for establishing the type-B uncertainty budget for S-parameter measurements. |
