Zugriffsnummer 19792
Dokumenttyp Konferenzartikel in Zeitschrift
Sprache Englisch
Titel Calibration and characterization of semiconductor X-ray detectors with synchrotron radiation
Autor(in); Institution
Krumrey, Michael; 7.1, Photonenradiometrie, PTB-Berlin
Gerlach, Martin; 7.1, Photonenradiometrie, PTB-Berlin
Scholze, Frank; 7.1, Photonenradiometrie, PTB-Berlin
Ulm, Gerhard; 7.1, Photonenradiometrie, PTB-Berlin
Quelle/Jahr Nuclear Instruments and Methods in Physics Research A: 568 (2006), 1, 364 - 368
ISSN 0168-9002
DOI
Verlag Amsterdam: Elsevier
Konferenzangaben 10th European Symposium on Semiconductor Detectors, Wildbad Kreuth, June 12-16, 2005, Germany
Klassifikationscode PACS: 07.85.Fv ; PACS: 29.40.Wk ; PACS: 85.60.Dw
Freie Schlagworte X-ray detectors ; Calibration ; Synchrotron radiation ; CdTe ; HPGe ; Si(Li)
Zusammenfassung Quantitative measurements of X-rays require absolutely calibrated detectors. In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the electron storage ring BESSY II in Berlin, X-ray detectors can be calibrated with low uncertainties. Two complementary approaches are realized for energy-dispersive detectors: the storage ring is used as primary source standard and the detector response to the calculable spectral photon flux is measured in the undispersed synchrotron radiation. This requires the operation of the storage ring with only a few stored electrons. The other approach is the comparison to a primary detector standard, mainly a cryogenic electrical substitution radiometer. Here monochromatized radiation of very high spectral purity has to be used which is available at different beamlines in the laboratory in the photon energy range from the UV up to about 120 keV. This method can also be applied for the calibration of none-dispersive detectors. With monochromatized radiation, the response function of energy-dispersive detectors is recorded and compared to Monte Carlo simulations. A photon energy dependent parameterization of the response function allows deconvoluting the experimental spectra. The responsivity of Si photodiodes and the detection efficiency of Si(Li), HPGe and CdTe detectors are determined with low uncertainties in a broad spectral range.

Zitierung

Krumrey, M., Gerlach, M., Scholze, F., & Ulm, G. (2006). Calibration and characterization of semiconductor X-ray detectors with synchrotron radiation. Nuclear Instruments and Methods in Physics Research A, 568(1), 364–368. https://doi.org/10.1016/j.nima.2006.06.004

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