| Zugriffsnummer | 19716 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Untersuchungen zur Messunsicherheit bei Abtastverfahren und Fourieranalyse |
| Übersetzungstitel | Measurement uncertainties of digital sampling and Fourier analysis |
| Autor(in); Institution |
Kürten Ihlenfeld, Waldemar Guilherme; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
|
| Quelle/Jahr | Neue Entwicklungen in der Messunsicherheitsermittlung : 06.-07. April 2006, Ilmenau /Thüringen ; Beiträge:(2006) |
| Availability | [CD-ROM] ; file name: 10 Ihlenfeld.pdf |
| ISBN | 3-00-018788-X ; 978-3-00-018788-9 |
| Verlag | Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik |
| Konferenzangaben | VDI/VDE-GMA-Workshop "Neue Entwicklungen in der Messunsicherheitsermittlung", Ilmenau, 06-07, April, 2006, Deutschland |
| Zusammenfassung | Digital sampling with high-resolution analog-to-digital converters and a subsequent Fourier transform on sampled data are indispensable tools in Metrology for decades. The most accurate sampling method known up-to-date is closely related to the lock-in technique and relies on synchronous signal synthesis with simultaneous synchronous sampling. This article presents analyses of measurement uncertainties of a Fourier transform on sampled data using this technique, which is indispensable for measuring ac quantities, for instance, impedance, phase and alternating power. The analyses account for many disturbing effects both on signal synthesis and acquisition including time-jitter and noise effects. An example for evaluating the measurement uncertainty of the root-mean-square value from samples is commented. |
