| Zugriffsnummer | 19389 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Coplanar microwave probe characterization: caveats and pitfalls |
| Autor(in); Institution |
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Schubert, Dirk; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 2006 IEEE MTT-S International Microwave symposium digest:(2006), 214 - 218 |
| Availability | [CD-ROM] ; file name: 67.ARFTG Conference Digest.pdf |
| Herausgeber(in) |
Sowers, Jim
|
| ISBN | 0-7803-9542-5 |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 67th ARFTG Microwave Measurements Conference: Measurements and Design of High Power Devices and Systems, San Francisco, Calif., 16, June, 2006, USA |
| Freie Schlagworte | wideband microwave properties ; standard coplanar microwave probes ; one- and two-port measurement methods |
| Zusammenfassung | In this paper, we investigate the wideband microwave properties of standard coplanar microwave probes using popular one- and two-port measurement methods. We illustrate the importance of accurate standard definitions and demonstrate the impact of the substrate material on the probe characteristics in a frequency range up to 50 GHz. |
