| Zugriffsnummer | 19249 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | AC longitudinal and contact resistance measurements of quantum Hall devices |
| Autor(in); Institution |
Schurr, Jürgen; 2.6, Elektrische Einheiten, PTB-Braunschweig
Ahlers, Franz Josef; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Hein, Günter; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Melcher, Jürgen; 2.6, Elektrische Einheiten, PTB-Braunschweig
Pierz, Klaus; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Overney, F.; Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
Wood, B. M.; Institute for National Measurement Standard, National Research Council, Ottawa, CANADA
|
| Quelle/Jahr | Metrologia: 43 (2006), 163 - 173 |
| ISSN | 0026-1394 |
| DOI | |
| URL | |
| Verlag | Bristol [u.a.]: IOP |
| Zusammenfassung | A new coaxial measurement system has been developed to investigate the ac longitudinal resistance along the high-potential side of the quantum Hall resistance (QHR). A novel equivalent circuit of the QHR is used to analyse the ac measurements of the longitudinal resistances along both the low- and high-potential sides of the QHR sample. In addition, a bridge for the measurement of ac contact resistances of the sample is presented. For the first time, it is now possible to perform all the ac measurements whose dc equivalents are well established for reliable dc quantum Hall measurements. While the ac longitudinal resistances on the high- and low-potential sides of the sample are very similar, interesting differences have been observed at high resolution. |
