| Zugriffsnummer | 19237 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Confirmation of the IMGC and PTB determinations of the silicon lattice spacing |
| Autor(in); Institution |
Cavagnero, G.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Mana, G.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Massa, E.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Becker, Peter; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
Kuetgens, Ulrich; 4.3, Quantenoptik und Längeneinheit, PTB-Braunschweig
|
| Quelle/Jahr | 2006 Conference on Precision Electromagnetic Measurements digest:(2006), 66 - 67 [print ed. and CD-ROM] |
| Herausgeber(in) |
Levi, Filippo; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
|
| ISBN | 88-7992-228-9 |
| Verlag | Torino: Ed. CLUT |
| Konferenzangaben | CPEM 2006, Torino, 09-14, July, 2006, Italy |
| Zusammenfassung | In 2004 measurements of the (220) lattice plane spacing of Si were reported, which had been carried out to resolve a discrepancy between previous determinations. It was subsequently found that the laser beam used was contaminated by a parasitic component having a different frequency. New lattice spacing measurements are intended to assess the correcting for the effective laser wavelength. |
