| Zugriffsnummer | 17952 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Tip geometry and tip-sample interactions in Scanning Probe Microscopy (SPM) |
| Autor(in); Institution |
Koenders, Ludger; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig
Yacoot, Andrew; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig
|
| Quelle/Jahr | Fringe 2005 : the 5th International Workshop on Automatic Processing of Fringe Patterns:(2005), 456 - 463 |
| Herausgeber(in) |
Osten, Wolfgang
|
| ISBN | 3-540-26037-4 |
| Verlag | Berlin [u.a.]: Springer |
| Konferenzangaben | 5th International Workshop on Automatic Processing of Fringe Patterns, Stuttgart, 11-14, September, 2005, Germany |
| Freie Schlagworte | Interaction forces ; Van der Waals forces ; Adhesion ; Tip shape ; Blind reconstruction ; Scanning probe microscopy ; SPM ; Scanning tunnelling microscopy ; STM ; Scanning force microscopy ; SFM |
| Zusammenfassung | Scanning probe microscopes allow to resolve small structures with very high resolution. Therefore, these instruments are essential for dimensional metrology from micro to atomic scale. The image obtained, however, is more than a morphological operation linking tip and sample geometry. To achieve high accuracy a detailed knowledge of the interaction between sample and tip is necessary. First approaches have been published, however, SPM techniques need more appropriate and more quantitative models. |
