| Zugriffsnummer | 17601 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry |
| Autor(in); Institution |
Travis, John, C.; National Institute of Standards and Technology, Chemical Science and Technology Laboratory (CSTL), Gaithersburg, MD, USA
Campos Acosta, Joaquin; Consejo Superior de Investigaciones Científicas (CSIC), Instituto de Fisica Aplicada (IFA), Madrid, SPAIN
Andor, György; Orsz.aacute.gos Mérésügyi Hivatal (OMH), Alapmérések I. Foosztály, Budapest, HUNGARY
Bastie, Jean; Conservatoire National des Arts et Metiers (CNAM), Institut National de Metrologie (BNM-INM), Paris, FRANCE
Blattner, Peter; Swiss Federal Office of Metrology and Accreditation (METAS), Length and Optics, Bern-Wabern, SWITZERLAND
Chunnilall, Christopher J.; National Physical Laboratory (NPL), Optical Radiation Metrology Group, Teddington, UK
Crosson, Steven C.; National Institute of Standards and Technology (NIST), Chemical Science and Technology Laboratory (CSTL), Gaithersburg, MD, USA
Duewer, David L.; National Institute of Standards and Technology (NIST), Chemical Science and Technology Laboratory (CSTL), Gaithersburg, MD, USA
Early, Edward A.; National Institute of Standards and Technology (NIST), Physics Laboratory (PL), Gaithersburg, MD, USA
Hengstberger, Franz; National Metrology Laboratory, Optical Radiometry and Radiation Pyrometry, CSIR, Pretoria, SOUTH AFRICA
Kim, Chang-Soon; Korea Research Institute of Standards and Science (KRISS), Photometry and Radiometry Group, Taejon, REPUBLIC OF KOREA
Liedquist, Leif; SP Swedish National Testing and Research Institute, Measurement Technology - Optics and Geometry, Borås, SWEDEN
Manoocheri, Farshid; Helsinki University of Technology, Metrology Research Institute, Department of Electrical and Communications Engineering, Espoo, FINLAND
Mercader, Flora; Centro Nacional de Metrología (CENAM), Division de Materiales Metalicos, Querétaro, MEXICO
Monard, L. A. G.; National Metrology Laboratory, Optical Radiometry and Radiation Pyrometry, CSIR, Pretoria, SOUTH AFRICA
Nevas, Saulius; Helsinki University of Technology, Metrology Research Institute, Department of Electrical and Communications Engineering, Espoo, FINLAND
Mito, Akihiro; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Time and Frequency Division, Ibaraki, JAPAN
Nilsson, Morgan; Karolinska University Hospital, Biomedical Engineering Department, Stockholm, SWEDEN
Noel, Mario; National Research Council Canada, Institute for National Measurement Standards, Photometry and Radiometry Group, Ottawa, CANADA
Corróns Rodriguez, Antonio; Consejo Superior de Investigaciones Cientificas (CSIC), Instituto de Fisica Aplicada (IFA), Madrid, SPAIN
Ruiz, Arquimedes; Centro Nacional de Metrologia (CENAM), Area de Fisica, Querétaro, MEXICO
Schirmacher, Alfred; 4.5, Optische Technologien, PTB-Braunschweig
Smith, Melody V.; National Institute of Standards and Technology (NIST), Chemical Science and Technology Laboratory (CSTL), Gaithersburg, MD, USA
Valencia, Guillermo; Centro Nacional de Metrologia (CENAM), Division de Optica y Radiometria, Querétaro, MEXICO
Van Tonder, Natasha; National Metrology Laboratory, Optical Radiometry and Radiation Pyrometry, CSIR, Pretoria, SOUTH AFRICA
Zwinkels, Joanne; National Research Council Canada, Institute for National Measurement Standards, Photometry and Radiometry Group, Ottawa, CANADA
|
| Quelle/Jahr | Journal of Physical and Chemical Reference Data: 34 (2005), 1, 41 - 56 |
| ISSN | 0047-2689 |
| Verlag | Melville, NY: AIP |
| Freie Schlagworte | Certified wavelengths ; holmium oxide solution ; intrinsic standards ; molecular absorption ; reference materials ; spectral convolution ; UV/visible spectrophotometry ; wavelength standards |
| Zusammenfassung | The transmittance minima of eighteen absorption bands of a solution of 40 g/L holmium oxide in 10 % (volume fraction) perchloric acid are certified as intrinsic secondary wavelength standards, by means of a multicenter measurement on material from a single source coupled with comparisons of a variety of preparations of the material evaluated on a single instrument. Fit-for-purpose artifact standards for the experimental calibration or validation of wavelength scales of chemical spectrophotometers can be carefully produced by end users themselves or by secondary standards producers. The intrinsic (data) standard confers traceability to the SI unit of length rather than costly transfer artifacts and repetitive calibration procedures. Certified values are provided for instrumental spectral bandwidths of 0.1 nm to 3.0 nm in 0.1 nm intervals, and information values are provided to a spectral bandwidth of 10 nm at wider intervals. Expanded uncertainties are typically less than ± 0.1 nm for certified bands. |
Zitierung
Travis, J. C., Campos Acosta, J., Andor, G., Bastie, J., Blattner, P., Chunnilall, C. J., Crosson, S. C., Duewer, D. L., Early, E. A., Hengstberger, F., Kim, C.-S., Liedquist, L., Manoocheri, F., Mercader, F., Monard, L. A. G., Nevas, S., Mito, A., Nilsson, M., Noel, M., Corróns Rodriguez, A., Ruiz, A., Schirmacher, A., Smith, M. V., Valencia, G., Van Tonder, N., & Zwinkels, J. (2005). Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry. Journal of Physical and Chemical Reference Data, 34(1), 41–56.