| Zugriffsnummer | 17533 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Layout and first XRF applications of the BAMline at BESSY II |
| Autor(in); Institution |
Riesemeier, H.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Ecker, K.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Görner, W.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Müller, B.-R.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Radtke, M.; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Krumrey, Michael; 7.1, Photonenradiometrie, PTB-Berlin
|
| Quelle/Jahr | X-Ray Spectrometry: 34 (2005), 160 - 163 |
| ISSN | 0049-8246 |
| DOI | |
| Verlag | Chichester [u.a.]: Wiley |
| Zusammenfassung | The first hard x-ray beamline at BESSY II has been installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a double-multilayer monochromator and a double-crystal monochromator. Depending on the application, the two devices are used separately or in-line. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis, micro computed tomography, x-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV is available for radiometric applications. |
