| Zugriffsnummer | 17514 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Linear frequency dependence in AC resistance measurement |
| Autor(in); Institution |
Schurr, Jürgen; 2.6, Elektrische Einheiten, PTB-Braunschweig
Wood, Barry M.; National Research Council, Institute for National Measurement Standards, Ottawa, CANADA
Overney, Frédéric; Swiss Federal Office of Metrology and Accreditation, Bern-Wabern, SWITZERLAND
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 54 (2005), 2, 512 - 515 |
| ISSN | 0018-9456 |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | CPEM 2004, London, 27, June - 02, July, 2004, UK |
| Freie Schlagworte | AC quantum Hall effect ; calculable ac-dc resistor ; coaxial ac bridge ; current equalizer |
| Zusammenfassung | The frequency dependence of ac resistors as well as the ac quantum Hall resistance shows sometimes unexpected linear terms of the order of 1·10-7 kHz-1. Three reasons for measuring linear terms are identified as systematic effects of the coaxial bridge and the compared resistors. |
