| Zugriffsnummer | 17507 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items |
| Autor(in); Institution |
Stumper, Ulrich; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 54 (2005), 2, 676 - 679 |
| ISSN | 0018-9456 |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | CPEM 2004, London, 27, June - 02, July, 2004, UK |
| Freie Schlagworte | 7-term TRL calibration ; sensitivity coefficients ; S-parameters ; uncertainty of calibration ; uncertainty of measurement ; vector network analyzer |
| Zusammenfassung | For the 7-term TRL calibration of a four-sampler vector network analyzer (VNA), expressions for the deviations of the S-parameters of two-port test objects are presented as functions of the deviations from the ideal values of the S-parameters of the TRL standards used. The sensitivity coefficients obtained are suitable for establishing the Type-B uncertainty budget for the S-parameter measurement. |
