Zugriffsnummer 17345
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Spectroscopic parameters of LVM absorption bands of carbon and oxygen impurities in isotopic enriched silicon 28Si, 29Si and 30Si
Autor(in); Institution
Sennikov, P. G.; Russian Academy of Sciences, Institute of Chemistry of High-Purity Substances, Nizhny Novgorod, RUSSIA
Kotereva, T. V.; Russian Academy of Sciences, Institute of Chemistry of High-Purity Substances, Nizhny Novgorod, RUSSIA
Kurganov, A. G.; Russian Academy of Sciences, Institute of Chemistry of High-Purity Substances, Nizhny Novgorod, RUSSIA
Andreev, B. A.; Russian Academy of Sciences, Institute for Physics of Microstructures, Nizhny Novgorod, RUSSIA
Niemann, Henning; 3.1, Metrologie in der Chemie, PTB-Braunschweig
Schiel, Detlef; 3.1, Metrologie in der Chemie, PTB-Braunschweig
Emtsev, V. V.; Russian Academy of Sciences, Ioffe Physicotechnical Institute, St. Petersburg, RUSSIA
Pohl, H.-J.; VITCON Projectconsult GmbH, Jena, GERMANY
Quelle/Jahr Fizika i technika poluprovodnikov = Physics and technics of semiconductors: 39 (2005), 3, 320 - 326
ISSN 0015-3222
URL
Verlag Sankt-Peterburg: Izd. Nauka
Zusammenfassung The IR spectra of all three Si isotopes in the form of bulk single crystals (28Si with enrichment more as 99.9%, 29Si and 30Si with enrichment more than 90%) has been studied at T = 300, 17 and 5 K in spectral range 550-1200 cm-1. IR active local vibrational modes (LVM) of the Si-12C centered at 605 cm-1 and of Si-16O-Si quasi-molecules in region of 1136 cm-1 for all Si isotopes in comparison with Si of natural isotopic composition as well as its isotopic shift at 300 and 17 K have been determined. The dependence of shape of antisymmetric stretching vibration band of 28Si-16O-28Si in spectrum of 28Si on spectral resolution has been studied. The perspectives of generalization of IR spectroscopy method for determination of carbon and oxygen impurities in Si of natural isotopic composition to mono-isotopic Si have been discussed.

Zitierung

Sennikov, P. G., Kotereva, T. V., Kurganov, A. G., Andreev, B. A., Niemann, H., Schiel, D., Emtsev, V. V., & Pohl, H.-J. (2005). Spectroscopic parameters of LVM absorption bands of carbon and oxygen impurities in isotopic enriched silicon ²⁸Si, ²⁹Si and ³⁰Si. Fizika i technika poluprovodnikov = Physics and technics of semiconductors, 39(3), 320–326.

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