| Zugriffsnummer | 16363 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays |
| Autor(in); Institution |
Behr, Ralf; 2.1, Gleichstrom und Niederfrequenz, PTB-Braunschweig
Funck, Torsten; 2.32, Wechsel-Gleich-Transfer, PTB-Braunschweig
Schumacher, Bernd; 2.12, Gleichstromgrößen, PTB-Braunschweig
Warnecke, Peter; 2.12, Gleichstromgrößen, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 52 (2003), 2, 521 - 523 |
| ISSN | 0018-9456 |
| Verlag | New York, NY: IEEE |
| Freie Schlagworte | Josephson voltage standard ; potentiometer ; quantized Hall resistance ; resistance ratio |
| Zusammenfassung | To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-kΩ standard resistors can be linked to a quantized Hall resistance (i = 2,12.9 kΩ) with an expanded uncertainty (k = 2) of less than 4 parts in 109. |
Zitierung
Behr, R., Funck, T., Schumacher, B., & Warnecke, P. (2003). Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays. IEEE Transactions on Instrumentation and Measurement, 52(2), 521–523.