| Zugriffsnummer | 16362 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Characterization of binary Josephson series arrays of different Types at BNM-LNE and comparisons with conventional SIS arrays |
| Autor(in); Institution |
Lo-Hive, Jean-Pierre; BNM-LNE, Fontenay-aux-Roses, FRANCE
Djordjevic, Sophie; BNM-LNE, Fontenay-aux-Roses, FRANCE
Cancela, Philippe; BNM-LNE, Fontenay-aux-Roses, FRANCE
Piquemal, François P. M.; BNM-LNE, Fontenay-aux-Roses, FRANCE
Behr, Ralf; 2.1, Gleichstrom und Niederfrequenz, PTB-Braunschweig
Burroughs, Charles J.; National Institute of Standard and Technology (NIST), Boulder, CO, USA
Seppä, Heikki; VTT Automation, Measurement Technology Department, Espoo, FINLAND
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 52 (2003), 2, 516 - 520 |
| ISSN | 0018-9456 |
| Verlag | New York, NY: IEEE |
| Freie Schlagworte | Binary Josephson arrays ; electrical measurements ; programmable voltage standard |
| Zusammenfassung | Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal- superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted superconductor-insulator-superconductor (es-SIS) Josephson junctions, have been tested at BNM-LNE. The arrays have been found to work properly. Results from direct comparisons with conventional SIS arrays show a good agreement with deviations of less than 0.5 nV at any nominal voltage between 41 mV and 1.3 V. |
Zitierung
Lo-Hive, J.-P., Djordjevic, S., Cancela, P., Piquemal, F. P. M., Behr, R., Burroughs, C. J., & Seppä, H. (2003). Characterization of binary Josephson series arrays of different Types at BNM-LNE and comparisons with conventional SIS arrays. IEEE Transactions on Instrumentation and Measurement, 52(2), 516–520.