| Zugriffsnummer | 16256 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon |
| Autor(in); Institution |
Bettin, Horst; 3.11, Dichte, PTB-Braunschweig
Toth, Hans; 3.11, Dichte, PTB-Braunschweig
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| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 52 (2003), 2, 636 - 640 |
| ISSN | 0018-9456 |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2002, Ottawa, 16-21, June, 2002, Canada |
| Zusammenfassung | To reveal the reason for the discrepancy of relatively 3·10-6 in the molar volume of silicon found in crystals of different origin, the densities of crystals grown under different conditions were compared using a flotation method. The method and the apparatus used at Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, and the evaluation of data using multipliers are described. The obtained results are reported and the contributions to the standard uncertainty of the silicon density ρsi ob about 1.0·10-7 ρsi are discussed. |
