| Zugriffsnummer | 16232 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Modular system for the calibration of capacitance standards based on the quantum Hall effect |
| Autor(in); Institution |
Melcher, Jürgen; 2.6, Elektrische Einheiten, PTB-Braunschweig
Schurr, Jürgen; 2.6, Elektrische Einheiten, PTB-Braunschweig
Pierz, Klaus; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Williams, J. M.; National Physical Laboratory (NPL), Teddington, UK
Giblin, S. P.; National Physical Laboratory (NPL), Teddington, UK
Cabiati, F.; Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), Torino, ITALY
Callegaro, L.; Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), Torino, ITALY
Marullo Reedtz, G.; Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), Torino, ITALY
Cassiago, C.; Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), Torino, ITALY
Jeckelmann, B.; Swiss Federal Office of Metrology and Accreditation (METAS), Bern-Wabern, SWITZERLAND
Jeanneret, B.; Swiss Federal Office of Metrology and Accreditation (METAS), Bern-Wabern, SWITZERLAND
Overney, F.; Swiss Federal Office of Metrology and Accreditation (METAS), Bern-Wabern, SWITZERLAND
Bohacek, J.; Czech Technical University, Faculty of Electrical Engineering, Prague, CZECH REPUBLIC
Riha, J.; Czech Technical University, Faculty of Electrical Engineering, Prague, CZECH REPUBLIC
Power, O.; National Metrology Laboratory, Enterprise Ireland, Dublin, IRELAND
Murray, J.; National Metrology Laboratory, Enterprise Ireland, Dublin, IRELAND
Nunes, M.; Instituto Nacional de Engenharia e Tecnologia Industrial, Lisboa CEDEX, PORTUGAL
Lobo, M.; Instituto Nacional de Engenharia e Tecnologia Industrial, Lisboa CEDEX, PORTUGAL
Godinho, I.; Instituto Nacional de Engenharia e Tecnologia Industrial, Lisboa CEDEX, PORTUGAL
|
| Quelle/Jahr | Spectrum of metrology: from the state-of-the-art to the everyday : NCSL International annual workshop and symposium, Tampa, [August 17 - 21, 2003] ; conference proceedings 2003:(2003) |
| Availability | [CD-ROM] ; file name: 6E-4.pdf |
| ISBN | 1-584-64041-3 |
| Verlag | Boulder, Colo.: NCSL International |
| Konferenzangaben | National Conference of Standards Laboratories (NCSL) International Annual Workshop and Symposium, Tampa, Florida, 17-21, September, 2003, USA |
Zitierung
Melcher, J., Schurr, J., Pierz, K., Williams, J. M., Giblin, S. P., Cabiati, F., Callegaro, L., Marullo Reedtz, G., Cassiago, C., Jeckelmann, B., Jeanneret, B., Overney, F., Bohacek, J., Riha, J., Power, O., Murray, J., Nunes, M., Lobo, M., & Godinho, I. (2003). Modular system for the calibration of capacitance standards based on the quantum Hall effect. National Conference of Standards Laboratories (NCSL) International Annual Workshop and Symposium, Tampa, Florida, 17-21, September, 2003, USA.