| Zugriffsnummer | 16111 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Optical and mechanical metrology |
| Autor(in); Institution |
Wilkening, Günter; 5.1, Nano- und Mikrometrologie, PTB-Braunschweig
|
| Quelle/Jahr | Recent advances in metrology and fundamental constants = Metrologia e costanti fondamentali: recenti sviluppi:(2001), 495 - 518 |
| Schriftenreihe | Proceedings of the International School of Physics Enrico Fermi: course 146 |
| Herausgeber(in) |
Quinn, T. J.
|
| ISBN | 1-58603-167-8 ; 4-274-90456-3 |
| Verlag | Amsterdam [u.a.]: IOS Press [u.a.] |
| Konferenzangaben | International School of Physics "Enrico Fermi", Course CXLVI "Recent advances in metrology and fundamental constants", Varenna, 25, July - 04, August, 2000, Italy |
| Freie Schlagworte | Dimensional Metrology |
| Zusammenfassung | The article describes recent advances in dimensional metrology, starting from measurements tasks, describing a general approach of metrology and new or imroved measurement methods and devices. |
