Zugriffsnummer 15949
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Measuring the shot noise of an ensemble of self-assembled InAs quantum dots
Autor(in); Institution
Nauen, André; Universität Hannover, Institut für Festkörperphysik, Hannover, GERMANY
Hapke-Wurst, Isabella; Universität Hannover, Institut für Festkörperphysik, Hannover, GERMANY
Hohls, Frank; Universität Hannover, Institut für Festkörperphysik, Hannover, GERMANY
Zeitler, Ulrich; Universität Hannover, Institut für Festkörperphysik, Hannover, GERMANY
Haug, Rolf J.; Universität Hannover, Institut für Festkörperphysik, Hannover, GERMANY
Pierz, Klaus; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Quelle/Jahr Physics of semiconductors 2002 : proceedings of the 26th International Conference on the Physics of Semiconductors held in Edinburgh, UK, 29 July - 2 August 2002:(2003)
Schriftenreihe Institute of Physics conference series: 171
Availability [CD-ROM] ; file name: D127.pdf
Herausgeber(in)
Long, A. R.
ISBN 0-7503-0924-5
Verlag Bristol: Institute of Physics (IOP) Publishing
Konferenzangaben 26th International Conference on the Physics of Semiconductors, Edinburgh, 29, July - 02, August 2002, UK
Freie Schlagworte shot noise ; InAs Quantum dots ; Fano factor ; single-electron tunnelling
Zusammenfassung We have measured the shot noise suppression in a sample containing self assembled InAs quantum dots. We observe a non-monotonic dependence of the Fano factor on the bias voltage that can be linked to single-electron tunnelling through the zero-dimensional ground state of the quantum dots.

Zitierung

Nauen, A., Hapke-Wurst, I., Hohls, F., Zeitler, U., Haug, R. J., & Pierz, K. (2003). Measuring the shot noise of an ensemble of self-assembled InAs quantum dots. 26th International Conference on the Physics of Semiconductors, Edinburgh, 29, July - 02, August 2002, UK.

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