Zugriffsnummer 15946
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Correlation of the physical properties and the interface morphology of AlGaAs/GaAs heterostructures
Autor(in); Institution
Gottwaldt, Lars; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Pierz, Klaus; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Ahlers, Franz Josef; 2.41, Halbleiterstrukturen, PTB-Braunschweig
Göbel, Ernst Otto; Präsidium, P, PTB-Braunschweig
Nau, S.; Philipps-University Marburg, Materials Science Center and Department of Physics, Marburg, GERMANY
Torunski, T.; Philipps-University Marburg, Materials Science Center and Department of Physics, Marburg, GERMANY
Stolz, W.; Philipps-University Marburg, Materials Science Center and Department of Physics, Marburg, GERMANY
Quelle/Jahr Journal of Applied Physics: 94 (2003), 4, 2464 - 2472
ISSN 0021-8979
Verlag Melville, NY: American Institute of Physics
Freie Schlagworte Interface morphology ; Heterostructure ; QHE ; PL ; PLE
Zusammenfassung We have investigated the influence of interface roughness in GaAs/AlGaAs heterostructures on both the optical and the electronic properties by varying systematically the two growth parameters substrate temperature and growth interruption. We prove that the optimization of samples for optics and transport, respectively, requires different growth parameters. Whereas the optical properties are exclusively determined by the roughness of the two quantum well interfaces, the transport properties are additionally influenced by the ionized impurity scattering. The number of impurities increases during growth interruption and consequently, in contrast to the optical samples, an optimisation of the growth parameters is not as straight forward since it depends on the background impurities originating from the UHV system. A direct correlation with information obtained from AFM-images is therefore only possible for the optical properties. At growth temperatures higher than 620°C in addition to the usual terrace structure a mesoscopic island structure appears and dominates the exciton luminescence linewidth.

Zitierung

Gottwaldt, L., Pierz, K., Ahlers, F. J., Göbel, E. O., Nau, S., Torunski, T., & Stolz, W. (2003). Correlation of the physical properties and the interface morphology of AlGaAs/GaAs heterostructures. Journal of Applied Physics, 94(4), 2464–2472.

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