| Zugriffsnummer | 15928 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Development and calibration of standards for the coating thickness in the range of micrometer and nanometer [poster] |
| Autor(in); Institution |
Hoffmann, Klaus-Peter; 5.12, Mikro- und Nanotopographie, PTB-Braunschweig
Ahbe, Thomas; 5.12, Mikro- und Nanotopographie, PTB-Braunschweig
Herrmann, Konrad; 5.12, Mikro- und Nanotopographie, PTB-Braunschweig
Hasche, Klaus; 5, Fertigungsmesstechnik, PTB-Braunschweig
Pohlenz, Frank; 5.12, Mikro- und Nanotopographie, PTB-Braunschweig
Sun, Jinghong; 5.12, Mikro- und Nanotopographie, PTB-Braunschweig
|
| Quelle/Jahr | Proceedings of Frontiers of Surface Engineering 2001. Surface and Coatings Technology: 169-170 (2003), 732 - 734 |
| Herausgeber(in) |
Takai, O.
|
| ISSN | 0257-8972 |
| Verlag | Amsterdam [u.a.]: Elsevier |
| Konferenzangaben | Frontiers of Surface Engineering 2001 ; FSE 2001, Nagoya, 28, October - 1, November, 2001, Japan |
| Freie Schlagworte | coating thickness ; standard ; calibration ; traceability |
| Zusammenfassung | PTB carries out investigations to develop, manufacture and calibrate reference standards for the coating thickness in the range from about 10 nm to 50 μm. The fundamental measurements ensuring the traceability to international accepted metrological standards are made by scanning electron microscopy and scanning force microscopy. Examples of standards are presented. The manufacture of sets of standards for practical applications is in preparation. |
