| Zugriffsnummer | 15101 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Fundamental parameter method for the low energy region including cascade effect and photoelectron excitation |
| Autor(in); Institution |
Kawahara, N.; Rigaku Corporation, Osaka, JAPAN
Shoji, T.; Rigaku Corporation, Osaka, JAPAN
Yamada, T.; Rigaku Corporation, Osaka, JAPAN
Kataoka, Y.; Rigaku Corporation, Osaka, JAPAN
Beckhoff, Burkhard; 7.12, Röntgenradiometrie, PTB-Berlin
Ulm, Gerhard; 7.1, Photonenradiometrie, PTB-Berlin
Mantler, M.; Institut für Angewandte und Technische Physik, Technische Universität Wien, AUSTRIA
|
| Quelle/Jahr | The proceedings of the Denver X-ray Conferences 2001. Advances in X-ray Analysis: 45 (2002), 511 - 516 |
| ISSN | 0376-0308 ; 1097-0002 |
| Verlag | Newtown Square, Pa.: |
| Konferenzangaben | Denver X-ray Conferences, Steamboat Springs, Colorado, 30, July -03, August, 2001, USA |
| Zusammenfassung | We have demonstrated the cascade effect and the secondary photoelctron excitation effect by means of Cr-L line measurements by using monochromatic radiation of high spectral purity and well-known flux provided by two beamlines of the Physikalisch-Technische Bundesanstalt (PTB), germany's national institute of metrology at the electron storage ring BESSY II. The plane grating monochromator beamline for undulator radiation covers the energy range from 30 eV to 1.9 keV, and the four-crystal monochromator beamline for synchrotron radiation from 1.75 keV to 10.5 keV. The Cr-L fluorescence intensities show a considerable jump at Cr-K edge energy as the source photon energy rises, indicating the magnitude of the cascade effect. The fundamental parameter method including the cascade effect and the secondary photoelectron excitation effect shows good agreement with the measurement. The evaluation of this computation method for the measurement carried out with a conventional XRF spectrometer also shows good performance of the calculation. |
