| Zugriffsnummer | 15045 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Characteristic impedance measurement of planar transmission lines |
| Autor(in); Institution |
Arz, Uwe; 2.22, Hochfrequenzmesstechnik, PTB-Braunschweig
Williams, Dylan F.; National Institute of Standards and Technology (NIST), Boulder, USA
Grabinski, Hartmut; Universität Hannover, Laboratorium für Informationstechnologie, Hannover, GERMANY
|
| Quelle/Jahr | XXVIIth General Assembly of the International Union of Radio Science = XXVIIe Assemblée Générale de L'Union Radio-Scientifique Internationale:(2002) |
| Availability | [CD-ROM] ; file name: 0956.pdf |
| Verlag | Maastricht: URSI |
| Konferenzangaben | URSI XXVIIth General Assembly, Maastricht, 17-24, August, 2002, The Netherlands |
| Freie Schlagworte | impedance of planar transmission lines ; lossless substrates ; high-speed digital interconnects on lossy silicon ; characteristic impedance ; calibration comparison ; planar transmission lines ; on-water measurement ; scattering parameters |
| Zusammenfassung | In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines such as CPW and microstrip on lossless substrates, and to lines on lossy silicon typical of high-speed interconnects including VLSI interconnects. |
